Session 11. Standards and Metrology


Development of standardized measurement methods, reference materials, and metrology ensure the accuracy and reliability of test results, quality consistency of manufacturing, and support all aspects of nanoscience research, R&D, and commercialization. This sub-conference provides a forum to discuss the scientific challenges, roadmap, and opportunities associated with these efforts.

Sub-conference topics include but not limited to:

Traceable measurements and instrumentation; uncertainty assessment associated with nanoscale measurements; reference material; nanotechnology standardization; nanometrology.